A Novel Iris Verification Framework Using Machine Learning algorithm on Embedded Systems
Published in 2020 IEEE 9th Global Conference on Consumer Electronics (GCCE), 2020
Recommended citation: Lo, C. Y., Sham, C. W., & Ma, L. (2020, October). A Novel Iris Verification Framework Using Machine Learning algorithm on Embedded Systems. In 2020 IEEE 9th Global Conference on Consumer Electronics (GCCE) (pp. 173-175). IEEE. https://ieeexplore.ieee.org/abstract/document/9291908/
Recommended citation:
@inproceedings{lo2020novel,
title={A Novel Iris Verification Framework Using Machine Learning algorithm on Embedded Systems},
author={Lo, Chun Yan and Sham, Chiu-Wing and Ma, Longyu},
booktitle={2020 IEEE 9th Global Conference on Consumer Electronics (GCCE)},
pages={173--175},
year={2020},
organization={IEEE}
}